Characteristics of coupled slow-wave microstrip lines

Publisher Website

1 January 1985

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 21 (20), 946-947
https://doi.org/10.1049/el:19850669

Abstract

The spectral-domain technique has been applied to investigate the characteristics of coupled slow-wave microstrip lines.

Keywords

Cited by 6 articles