DEFLECTION MEASUREMENTS AS METHOD TO DETERMINE RESIDUAL STRESS IN THIN HARD COATINGS ON TOOL MATERIALS
- 1 January 1996
- journal article
- Published by SAGE Publications in Surface Engineering
- Vol. 12 (1), 43-48
- https://doi.org/10.1179/sur.1996.12.1.43
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Strength, fracture and erosion properties of CVD diamondPhilosophical Transactions A, 1993
- Effect of process parameters on the residual stresses and the wear behavior of aluminum nitride physical vapor deposition coatingsSurface and Coatings Technology, 1992
- X-ray elastic constants and residual stress of textured titanium nitride coatingSurface and Coatings Technology, 1992
- Intrinsic stress in sputter-deposited thin filmsCritical Reviews in Solid State and Materials Sciences, 1992
- A new and simple micromechanical approach to the stress-strain characterization of thin coatingsJournal of Micromechanics and Microengineering, 1991
- Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray ScatteringMRS Proceedings, 1991
- Stresses and deformation processes in thin films on substratesCritical Reviews in Solid State and Materials Sciences, 1988
- Residual stress measurement of refractory coatings as a nondestructive evaluationJournal of Materials for Energy Systems, 1985
- Stress distributions and thin film mechanical propertiesSurface and Interface Analysis, 1981
- The tension of metallic films deposited by electrolysisProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1909