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THE HOT-ELECTRON PROBLEM IN SUBMICRON MOSFET
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THE HOT-ELECTRON PROBLEM IN SUBMICRON MOSFET
THE HOT-ELECTRON PROBLEM IN SUBMICRON MOSFET
WH
W. Hänsch
W. Hänsch
MO
M. Orlowski
M. Orlowski
WW
W. Weber
W. Weber
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1 September 1988
journal article
Published by
EDP Sciences
in
Le Journal de Physique Colloques
Vol. 49
(C4)
,
C4-597
https://doi.org/10.1051/jphyscol:19884126
Abstract
Supplément au Journal de Physique Colloques, Journal de Physique Archives représente une mine dinformations facile à consulter sur la manière dont la physique a été publiée depuis 1872.
Keywords
HOT CARRIERS
DEGRADATION
MICROELECTRONICS
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Cited by 7 articles