Speckle pattern and holographic techniques in engineering metrology
- 28 February 1971
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 3 (1), 26-30
- https://doi.org/10.1016/s0030-3992(71)80007-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970
- A method for reducing movement in holographic emulsionsJournal of Physics E: Scientific Instruments, 1969
- Measurement of in-plane surface strain by hologram interferometryJournal of Physics E: Scientific Instruments, 1968