Detector system for backscattered electrons by conversion to secondary electrons
- 1 January 1979
- Vol. 2 (4), 238-248
- https://doi.org/10.1002/sca.4950020406
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- SEM imaging of the cell structure of dislocation networks in cold worked cu single crystalsScanning, 1978
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- Effets de contraste cristallin en microscopie électronique à balayageMicron (1969), 1969