Abstract
Auger spectroscopy has shown that the divalent cation impurities Zn++, Cd++, and Pb++ in the concentration range above 0.1% segregate to the surface of silver halide films. Sputtering of the films shows a layer approximately 10 Å thick at the film‐vacuum interface where the impurities accumulate. The surface ratio of impurity to silver ion increases with the total amount of impurity present.