A simple specimen airlock for field-ion microscopes
- 1 February 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (2), 121-122
- https://doi.org/10.1088/0022-3735/6/2/004
Abstract
A specimen holder and airlock have been constructed for an ultrahigh vacuum field-ion microscope. After a new specimen is introduced through this airlock, ion images of the specimen may be observed at a background pressure of less than 0.2 mu Pa within 30 min.Keywords
This publication has 1 reference indexed in Scilit:
- Field-ion Microscopy of Titanium CarbidePhilosophical Magazine, 1967