Method for the Precise Determination of Orientation from Electron Diffraction Patterns
- 1 October 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (10), 3267-3268
- https://doi.org/10.1063/1.1702963
Abstract
A method for the exact determination of orientation from electron diffraction patterns by diffracted beam intensity measurements is presented. The method is applicable to strain‐free specimens and results indicate that the accuracy obtained is considerably better than previous techniques.Keywords
This publication has 1 reference indexed in Scilit:
- Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction PatternsPhysica Status Solidi (b), 1964