An Information Theoretic Approach to Digital Fault Testing

1 August 1981

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-30 (8), 582-587
https://doi.org/10.1109/tc.1981.1675843

Abstract

The concepts of information theory are applied to the problem of testing digital circuits. By analyzing the information throughput of the circuit an expression for the probability of detecting a hardware fault is derived. Examples are given to illustrate an application of the present study in designing efficient pattern generators for testing.

Keywords

This publication has 6 references indexed in Scilit:

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