Characterization of structural features in thin layers of GaAs, Al(x)Ga(1-x)As and AlAs by means of structure factor imaging and high resolution electron microscopy
- 31 December 1985
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 40 (5-6), 835-845
- https://doi.org/10.1016/0584-8547(85)80136-1
Abstract
No abstract availableKeywords
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