The Microstructure of RuO2Thick Film Resistors and the Influence of Glass Particle Size on their Electrical Properties
- 1 June 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 7 (2), 166-175
- https://doi.org/10.1109/tchmt.1984.1136345
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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