Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal
- 8 June 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 46 (23), 1540-1543
- https://doi.org/10.1103/physrevlett.46.1540
Abstract
The (220) lattice plane spacing of an almost perfect crystal of silicon was measured by means of a combined scanning () x-ray interferometer and a two-beam optical interferometer. From 170 measurements, a value fm results in vacuum at 22.50°C. This value is smaller by than that reported by Deslattes et al. for another crystal. Generic variabilities of the two crystals account only for a part of this difference.
Keywords
This publication has 10 references indexed in Scilit:
- Remeasurement of γ-Ray reference linesAnnals of Physics, 1980
- The Avogadro Constant *Annual Review of Physical Chemistry, 1980
- A simple Bragg-spacing comparatorActa Crystallographica Section A, 1978
- Avogadro Constant—Corrections to an Earlier ReportPhysical Review Letters, 1976
- Über den Einfluß der Beugung auf die interferentielle LängenmessungMetrologia, 1976
- Determination of the Avogadro ConstantPhysical Review Letters, 1974
- X-Ray to Visible Wavelength RatiosPhysical Review Letters, 1973
- A two-crystal X-ray interferometerThe European Physical Journal A, 1968
- Laser Beams and ResonatorsApplied Optics, 1966
- Principles and design of Laue-case X-Ray interferometersThe European Physical Journal A, 1965