Radiation-enhanced diffusion of boron in germanium during ion implantation

Abstract
An effect of radiation-enhanced diffusion during boron ion implantation into 200-500°C germanium substrates has been found. The boron-enhanced diffusion coefficient is independent of the temperature over the range 200-500°C during ion implantation, depends upon the dose rate of the incident ions and its value corresponds to the thermal diffusion of boron in germanium at 800°C.