New Fabrication Method and Electrical Characteristics of Conical Silicon Field Emitters
- 1 March 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (3R)
- https://doi.org/10.1143/jjap.34.1493
Abstract
A new fabrication method for a silicon field emitter has been proposed, which combines the techniques of Si KOH anisotropic etching and local oxidation of silicon (LOCOS) to form the emitter tip. The fabricated conical silicon emitter had an extremely well-defined structure indicative of good reproducibility and uniformity of the fabrication process. The emission characteristics were examined under DC and AC conditions, and indicated high performance of the emitter. Successful application to a digit display has been demonstrated.Keywords
This publication has 13 references indexed in Scilit:
- Emission characteristics of silicon vacuum triodes with four different gate geometriesIEEE Transactions on Electron Devices, 1993
- Low-Operation-Voltage Comb-Shaped Field Emitter ArrayJapanese Journal of Applied Physics, 1992
- Formation of silicon tips with <1 nm radiusApplied Physics Letters, 1990
- Field-emission properties of surface-processed TiC tipsJournal of Physics D: Applied Physics, 1989
- Modeling of stress effects in silicon oxidationIEEE Transactions on Electron Devices, 1989
- Field emission from tungsten-clad silicon pyramidsIEEE Transactions on Electron Devices, 1989
- Formation of submicron silicon-on-insulator structures by lateral oxidation of substrate-silicon islandsJournal of Vacuum Science & Technology B, 1988
- Oxidation induced stresses and some effects on the behavior of oxide filmsJournal of Applied Physics, 1983
- The Oxidation of Shaped Silicon SurfacesJournal of the Electrochemical Society, 1982
- Physical properties of thin-film field emission cathodes with molybdenum conesJournal of Applied Physics, 1976