A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO)
- 1 June 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (3), 473-478
- https://doi.org/10.1109/19.106275
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Turn-On and Turn-Off Characteristics of a 4.5-kV 3000-A Gate Turn-Off ThyristorIEEE Transactions on Industry Applications, 1986
- Measurement and analysis of carrier distribution and lifetime in fast switching power rectifiersIEEE Transactions on Electron Devices, 1980
- Infrared Observation of Current Distributions in Large Area Power TransistorsIEEE Transactions on Industrial Electronics and Control Instrumentation, 1974
- On the radiative recombination rate in siliconPhysica Status Solidi (a), 1972