Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (11), 1965-1971
- https://doi.org/10.1109/16.333812
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
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