Study of the local electrical properties of metal surfaces using an AFM with a conducting probe
- 1 March 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
- Vol. 21 (1), 76-81
- https://doi.org/10.1109/95.679036
Abstract
No abstract availableKeywords
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