On the quantitative analysis of field-ion micrographs
- 31 October 1974
- journal article
- Published by Elsevier in Metallography
- Vol. 7 (5), 403-430
- https://doi.org/10.1016/0026-0800(74)90041-x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Computer techniques in the analysis of field‐ion micrographsJournal of Microscopy, 1972
- General properties of the field-ion image projectionSurface Science, 1971
- The shape of field-evaporated metal tipsSurface Science, 1971
- On field-evaporation end forms of a bcc metal surface observed by a field ion microscopeSurface Science, 1969
- A method for indexing field ion micrographsJournal of Scientific Instruments, 1967
- The accurate determination of crystal orientation from field ion micrographsJournal of Scientific Instruments, 1964