Deviations from Friedel's law in the case of anomalous transmission of X-rays have been estimated in as-grown silicon crystals. The results of measurements on a double crystal spectrometer agree with the dynamical theory of elastically deformed crystals. Using this theory, we have obtained information about growth deformation in crystals containing a small number of dislocations or in dislocation-free ones. Radii of curvature of crystal lattice planes of the order of km, orientation differences of the order of 0.1" and relative changes of lattice constants of the order of 10-3% have been estimated. Dislocation loops were observed at the boundary between the dislocation-free and the distorted part of the crystal.