Electron-Electron Scattering in Ti
- 29 December 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 35 (26), 1786-1789
- https://doi.org/10.1103/physrevlett.35.1786
Abstract
The -axis, temperature-dependent electrical resistivity of high-purity, stoichiometric Ti is proportional to from at least 10 to 400 K. This unique behavior is apparently caused by electron-electron scattering.
Keywords
This publication has 19 references indexed in Scilit:
- The verification of the existence of TiS2Materials Research Bulletin, 1975
- Photoemission studies of the band structures of transition metal dichalcogenides. I. Groups IVA and IVBJournal of Physics C: Solid State Physics, 1974
- Optical, electrical-transport, and heat-capacity studies of the solid solutions , , andPhysical Review B, 1974
- Spin fluctuations in actinide intermetallic compoundsPhysical Review B, 1974
- Resistivity of nearly magnetic metals at high temperatures: Application to neptunium and plutoniumPhysical Review B, 1974
- Electron-Electron Scattering in the Transport Coefficients of Simple MetalsPhysical Review B, 1973
- Experimental Study of the Solid SolutionsPhysical Review Letters, 1972
- Temperature Dependence of the Low-Field Galvanomagnetic Coefficients of BismuthPhysical Review B, 1969
- Electron-Electron Scattering in Transition MetalsPhysical Review Letters, 1968
- The contribution to the electrical resistance of metals from collisions between electronsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1937