Interferometric Determination of Apparent Thickness of Coatings
- 1 February 1947
- journal article
- research article
- Published by Springer Nature in Nature
- Vol. 159 (4033), 228-229
- https://doi.org/10.1038/159228a0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Thickness Measurements of Thin FilmsNature, 1946
- Studies on the Structure of Thin Metallic Films by Means of the Electron MicroscopeJournal of Applied Physics, 1943
- The conductivity of thin films of thallium on a pyrex glass surfaceProceedings of the Physical Society, 1939
- Durchlässigkeit und Reflexionsvermögen dünner Silberschichten von Ultrarot bis UltraviolettThe European Physical Journal A, 1936
- A colorimetric method for the quantitative determination of small amounts of silver by use of p-dimethylaminobenzalrhodanineJournal of Research of the National Bureau of Standards, 1935