Methods for Determining Film Thickness and Optical Constants of Films and Substrates
- 1 March 1971
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 61 (3), 351-359
- https://doi.org/10.1364/josa.61.000351
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- Improved dielectric films for multilayer coatings and mirror protectionJournal de Physique, 1964
- La détermination de l'indice et de l'épaisseur des couches minces transparentesJournal de Physique et le Radium, 1950