Experimental demonstrations of direct adsorbate site identification using photoelectron diffraction
- 27 September 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 71 (13), 2054-2057
- https://doi.org/10.1103/physrevlett.71.2054
Abstract
A recently proposed direct method has been applied to the analysis of experimental backscattering photoelectron diffraction data for the three adsorption systems Cu{110}-CO, Cu{111}-, and Cu{111}- . The local adsorption sites are determined through the identification of the nearest-neighbor substrate atom directions which can be determined with an accuracy of ±5°.
Keywords
This publication has 17 references indexed in Scilit:
- Holographic imaging of atoms using multiple-wave-number electron angular distribution patternsPhysical Review Letters, 1993
- High-energy photoelectron holography for an adsorbate test system:c(2×2)S on Ni(001)Physical Review Letters, 1993
- Direct photoelectron-diffraction method for adsorbate structural determinationsPhysical Review B, 1992
- Chemical shift photoelectron diffraction from molecular adsorbatesPhysical Review Letters, 1992
- A photoelectron diffraction study of the structure of PF3 adsorbed on Ni{in111}Chemical Physics Letters, 1992
- Reevaluation of thep(2×2)S/Cu(001) structure using angle-resolved photoemission extended fine-structure spectroscopyPhysical Review B, 1992
- Adsorbate structures from photoelectron diffraction: Holographic reconstruction or real-space triangulation?Physical Review Letters, 1992
- Surface structure determination by X-ray diffractionSurface Science Reports, 1989
- Photoelectron HolographyPhysical Review Letters, 1988
- c(2×2)S/Cr(001) surface and near-surface structure determined using angle-resolved photoemission extended fine structurePhysical Review B, 1988