Accurate Characterization of Subgrain Boundaries in a TEM
- 16 May 1983
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 77 (1), 291-308
- https://doi.org/10.1002/pssa.2210770134
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Nomenclature for dislocation arraysScripta Metallurgica, 1982
- Accurate determination of crystallographic orientation from Kikuchi patternsPhilosophical Magazine A, 1981
- Grain boundary analysis in TEM. I. Practical determination of bicrystal orientationsPhysica Status Solidi (a), 1978
- Precise Determination of the Relative Orientation of Two Crystals from the Analysis of Two Kikuchi PatternsPhysica Status Solidi (a), 1975
- Characterization of bicrystals using kikuchi patternsMetallurgical Transactions, 1973