A study of the mixed-valency compound Cs2SbCl6 by X-ray photoelectron spectroscopy

Abstract

It is shown that the presence of distinct Sb^III and Sb^V atoms in the mixed-valency compound Cs₂SbCl₆ can be directly demonstrated by X-ray photoelectron spectroscopy. The surface purity of the material can be checked by supplementary studies using argon ion bombardment.