Single Thermal Scan DLTS Method
- 1 August 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (8)
- https://doi.org/10.1143/jjap.20.1589
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974