Soft x-ray and vacuum-ultraviolet spectroscopy of ion-beam-heated thin targets

Abstract

XUV spectroscopy utilizing a 1‐m grazing incidence spectrograph and photoelectric diodes is used to determine the response of approximately one‐proton‐range‐thick planar targets to an intense beam of hydrogen and carbon ions. Electron temperature, brightness temperature, and total radiated power are then compared with radiation‐hydrodynamic calculations to determine the ion‐beam energy deposition and incident current density. Incident current densities of 25–35 kA/cm² with 80% proton current and 20% singly ionized carbon ion current are consistent with the spectroscopic measurements.