Abstract
An effective-medium theory, for the flicker (1/f) noise amplitude, is formulated for random resistor networks. Close to the percolation threshold pc, the magnitude of the noise is shown to diverge as ( p - pc)-κ, with κ = 1 for both site and bond percolation models. The exponent κ is also calculated in the framework of two different renormalization group transformations. The possible observation of the predicted behaviour in metal-insulator mixtures and cermets is discussed