Assessment of dielectric degradation by ultrawide-band PD detection
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Dielectrics and Electrical Insulation
- Vol. 2 (5), 744-760
- https://doi.org/10.1109/94.469971
Abstract
No abstract availableThis publication has 53 references indexed in Scilit:
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