Abstract
Spin wave resonance in epitaxial films of Y 2.85La0.15Fe3.75Ga1.25O12 is used to determine the variation of the magnetic anisotropy within these films. The difference between the magnetic anisotropy of the ’’transient layer’’, and the layers remote from the substrate has been investigated. It is shown that the anisotropy of the transient is not affected by ’’meltback’’ nor by interdiffusion between the film and the substrate but is related to the different growth conditions during the transient period compared with those during the ’’steady state’’ growth regime. The anisotropy of the transient layer of vertically dipped film is shown to be same as the anisotropy of the bulk of a film obtained by horizontal dipping under the same conditions, using fast rotation.