Improvements to atomic force microscopy cantilevers for increased stability
- 1 December 1996
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 67 (12), 4191-4197
- https://doi.org/10.1063/1.1147568
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Improvement of thermally induced bending of cantilevers used for atomic force microscopyScanning, 1995
- Resonance response of scanning force microscopy cantileversReview of Scientific Instruments, 1994
- Observation of a chemical reaction using a micromechanical sensorChemical Physics Letters, 1994
- A nondestructive method for determining the spring constant of cantilevers for scanning force microscopyReview of Scientific Instruments, 1993
- Mechanical and thermal effects of laser irradiation on force microscope cantileversUltramicroscopy, 1992
- Atomic Force MicroscopePhysical Review Letters, 1986
- Analysis of Bi-Metal ThermostatsJournal of the Optical Society of America, 1925