Photoluminescence study of excitons localized in indirect-gapGaAs1xPx

Abstract
A novel structure (M0X) in the photoluminescence spectra from n-type indirect-gap GaAs1xPx alloys has been studied in detail. It has an asymmetric line shape and prominent X-point phonon sidebands. Its binding energy relative to the free-exciton band edge (EgxX) is very shallow. The characteristic lifetime of fluorescence decay has been found to vary rapidly over the M0X band linewidth. It is proposed that the M0X band is due to exciton bound by potential wells resulting from the alloy compositional fluctuation. The narrowing of the M0X band's linewidth at rising temperatures and the temperature quenching of fluorescence with the excited state can be accounted for by the strong energy dependence of the effective range of the localized exciton wave function. The decrease of the M0X quantum efficiency with increasing laser power is attributed to Auger decay of biexcitons.