Towards higher resolution in electron beam sensitive specimens of biological origin
- 2 August 1974
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 101 (3), 299-309
- https://doi.org/10.1111/j.1365-2818.1974.tb03955.x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Beam Efficiency, Inelastic Scatter, and Radiation Damage in the High-Voltage MicroscopeJournal of Applied Physics, 1972
- Rate of damage of polymer crystals in the electron microscope: Dependence on temperature and beam voltagePhilosophical Magazine, 1971
- Limitations to significant information in biological electron microscopy as a result of radiation damageJournal of Ultrastructure Research, 1971
- High‐resolution electron microscopy of high‐modulus carbon fibres*Journal of Microscopy, 1971
- Radiation damage of polymers in the million volt electron microscopeRadiation Effects, 1970
- Ion damage to metal films inside an electron microscopePhilosophical Magazine, 1961
- Examination of Cellulose Fibre by the Low-Temperature Specimen Method of Electron Diffraction and Electron MicroscopyNature, 1958