Etude du bruit de generation—recombinaison de diodes Gunn
- 31 August 1973
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 16 (8), 853-860
- https://doi.org/10.1016/0038-1101(73)90091-9
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Experimental study of the correlation of f.m. and l.f. noise in Gunn oscillatorsElectronics Letters, 1972
- Semiconductor impurity analysis from low-frequency noise spectraIEEE Transactions on Electron Devices, 1971
- Statistics of the Charge Distribution for a Localized Flaw in a SemiconductorPhysical Review B, 1957