On‐line computation of diffractograms for the analysis of SEM images
- 1 January 1980
- Vol. 3 (4), 273-279
- https://doi.org/10.1002/sca.4950030403
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- STEM semiconductor detector for testing SEM quality parametersScanning, 1979
- Quality control of SEM micrographs by laser diffractometryScanning, 1978
- Notizen: Zur Defokussierungsabhängigkeit des Phasenkontrastes bei der elektronenmikroskopischen AbbildungZeitschrift für Naturforschung A, 1966
- An algorithm for the machine calculation of complex Fourier seriesMathematics of Computation, 1965