Impact ionization of excitons by hot carriers in quantum wells
- 1 November 1998
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 13 (11), 1258-1261
- https://doi.org/10.1088/0268-1242/13/11/004
Abstract
Dissociation of free excitons into electrons and holes, due to collisions between the excitons and charge carriers accelerated by an in-plane electric field in a multiple quantum well structure, is considered. We found that at normally used 2D excitonic concentrations the impact ionization process is rather strong and dominates over the exciton formation process at electric fields of the order of a few hundred V .Keywords
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