THE MEASUREMENT OF INFRAREL REFLECTION-ABSORPTION SPECTRA OF THIN POLYVINYLACETATE FILMS FORMED ON SILICON SURFACES
- 5 July 1983
- journal article
- Published by Oxford University Press (OUP) in Chemistry Letters
- Vol. 12 (7), 1077-1080
- https://doi.org/10.1246/cl.1983.1077
Abstract
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