Angular distribution and differential sputtering yields for low-energy light-ion irradiation of polycrystalline nickel and tungsten
- 1 April 1980
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 21 (4), 327-333
- https://doi.org/10.1007/bf00895923
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profilingApplied Physics B Laser and Optics, 1977
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- Anisotropic emission in single crystal sputtering measurements on HCP single crystalsRadiation Effects, 1973
- Randomisation of crystal structure within energetic collision cascades revealed by the sputtering of Au single crystals during ion bombardmentRadiation Effects, 1971
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969
- Atomic collision sequences in crystals of copper, silver and gold revealed by sputtering in energetic ion beamsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1961
- Sputtering of Metal Single Crystals by Ion BombardmentJournal of Applied Physics, 1955
- Bemerkung zur Theorie der KathodenzerstäubungThe European Physical Journal A, 1935
- KathodenzerstäubungsproblemeAnnalen der Physik, 1926
- Über die zerstäubende Wirkung der Kanalstrahlen (Emission sekundärer Atomstrahlen)Berichte der Bunsengesellschaft für physikalische Chemie, 1908