Use of Electron Probes in the Study of Recombination Radiation

Abstract

The electron probe microanalyzer has been used to study the local variations in recombination radiation from gallium arsenide. The intensity of recombination radiation from different specimens varies by several orders of magnitude. Local fluctuations are observed which are attributed to surface deformation and to non‐uniform distribution of impurities. Within experimental error, the wavelength distribution was indistinguishable from the wavelength distribution from GaAs diodes.