Fine Structure of theKX-Ray Absorption Edge of Germanium

Abstract

A double-crystal spectrometer, with a proportional counting system for intensity measurement, has been employed for the investigation of the x-ray absorption structure on the high-energy side of the Ge $K$ edge, using 38% polarized x rays and a thin single crystal of germanium in the transmission method. The structure was studied up to 185 ev from the main edge and several new absorption structure features, not reported hitherto, were obtained. These features are satisfactorily explained by Hayasi's theory in the close-in region and by Kronig's theory in the extended region. A significant shift, without any intensity variation, was noted in the extended fine structure on changing the orientation of the single-crystal absorber. A quantitative correlation has been made between the observed structures and the theoretically predicted values with a view to testing different theories on absorption fine structure.