Relaxation and diffusion study by small angle neutron scattering technique in amorphous semiconductor superlattices
- 1 April 1986
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 81 (1-2), 41-51
- https://doi.org/10.1016/0022-3093(86)90257-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Interdiffusion and chemical ordering in composition-modulated Fe70Si30/Si amorphous thin filmsJournal of Applied Physics, 1985
- Surface states and magnetic heterogeneity in iron-based glassesJournal de Physique Lettres, 1985
- Spinodal decomposition in amorphous systemsJournal of Non-Crystalline Solids, 1984
- Diffusion of P in amorphous Fe85B15Scripta Metallurgica, 1981
- Diffusion and structural relaxation in compositionally modulated amorphous metal filmsApplied Physics Letters, 1980
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980
- Effect of Gradient Energy on Diffusion in Gold-Silver AlloysJournal of Applied Physics, 1969