Direct Determination of Stacking Disorder in Layer Structures
- 15 May 1947
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 71 (10), 715-717
- https://doi.org/10.1103/physrev.71.715
Abstract
A stack of identical, parallel, and equidistant layers is used as a simple model of a layer structure. Irregularities in the relative displacements parallel to the plane of the layers correspond to stacking disorder. The stacking disorder is described by means of a set of functions which measure the probability of finding a relative displacement for layers spacings apart. It is shown that x-ray diffraction data permit a direct determination of the Fourier coefficients of the functions . Thus these functions can be synthesized and the nature of the stacking disorder directly deduced.