High‐Resolution Transmission Electron Microscopy of Ti4AlN3, or Ti3Al2N2 Revisited
- 1 September 1999
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 82 (9), 2545-2547
- https://doi.org/10.1111/j.1151-2916.1999.tb02117.x
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- The Raman spectrum of Ti3SiC2Journal of Applied Physics, 1998
- Comment on “New Ternary Nitride in the Ti–Al–N System”Journal of the American Ceramic Society, 1998
- fcc titanium in titanium/silver multilayersMaterials Letters, 1997
- Fabrication and characterization of M2SnC (M = Ti, Zr, Hf and Nb)Scripta Materialia, 1997
- New Ternary Nitride in the Ti‐Al‐N SystemJournal of the American Ceramic Society, 1997
- Layered machinable ceramics for high temperature applicationsScripta Materialia, 1997
- fcc titanium in Ti-Al multilayersMaterials Letters, 1994
- Inorganic structure types with revised space groups. IActa crystallographica Section B, Structural science, crystal engineering and materials, 1991
- The ternary system titanium-aluminum-nitrogenJournal of Solid State Chemistry, 1984
- Ti2AlN, eine stickstoffhaltige H-PhaseMonatshefte für Chemie / Chemical Monthly, 1963