Verification of analytic point defect models using SUPREM-IV (dopant diffusion)
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 7 (2), 181-190
- https://doi.org/10.1109/43.3148
Abstract
No abstract availableKeywords
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