Avalanche punch-through erase (APTE) mode in dual-dielectric charge-storage (DDC) cells
- 1 May 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 24 (5), 531-535
- https://doi.org/10.1109/t-ed.1977.18773