Characteristic photon emission from ion bombarded silicon and silica surfaces
- 9 February 1976
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 55 (8), 483-485
- https://doi.org/10.1016/0375-9601(76)90231-0
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Effects of nonradiative de-excitation of excited sputtered atoms near silicon and silicon dioxide surfacesSurface Science, 1975
- Bombardment-induced photon emission from Al and Al2O3 targetsSurface Science, 1974
- Quantitative Spectrochemical Analyses of Feldspars by Ion BombardmentNature, 1974
- Surface Composition Determined by Analysis of Impact RadiationScience, 1972
- An investigation of the velocity spectrum of excited particles by fast ions from a solid as a means to study its electronic level structureRadiation Effects, 1972
- Progress in analytic methods for the ion microprobe mass analyzerInternational Journal of Mass Spectrometry and Ion Physics, 1969
- On the excited state of sputtered particlesNuclear Instruments and Methods, 1965
- Theory of Auger Ejection of Electrons from Metals by IonsPhysical Review B, 1954
- Neutralization of Ions and Ionization of Atoms Near Metal SurfacesPhysical Review B, 1953