Atomic rearrangements of supported Bi particles observed by high-resolution electron microscopy

Abstract

The morphology of supported Bi particles is studied using the technique of profile imaging at atomic resolution. These particles show a crystallized Bi core surrounded by an amorphous (or liquid) material. For small supported particles (diameter of the Bi core, about 6-9 nm) observed by high-resolution electron microscopy at room temperature, the lattice fringe orientation changes very rapidly during the observation. This fluctuating evolution is attributed to atomic rearrangements of the particle induced by the microscope electron beam. During this evolution, a decrease in the size of the crystallized Bi core is sometimes observed for the smaller particles.