Analysis of the relationship between temperature dependence of the libration mode and dielectric relaxation in NaNO2
- 1 May 1973
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 12 (9), 847-851
- https://doi.org/10.1016/0038-1098(73)90092-6
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Analysis of the Temperature-Dependent Phonon Structure in Sodium Nitrite by Raman SpectroscopyPhysical Review B, 1972
- Nuclear Relaxation in Hf Studied by Gamma-Gamma Angular CorrelationPhysical Review B, 1970
- Dielectric Relaxation Mechanism in NaNO2Journal of the Physics Society Japan, 1968
- Experimental Study on Dielectric Relaxation in NaNO2Journal of the Physics Society Japan, 1968
- Dynamics of the Ising Model near the Critical Point. IJournal of the Physics Society Japan, 1968
- Electrical Properties of NaNO2 Single Crystal in the Vicinity of the Ferroelectric Curie TemperatureJournal of the Physics Society Japan, 1967
- Raman Spectrum and Phase Transition in the Ferroelectric Crystal NaNO2Physica Status Solidi (b), 1966
- Time-Dependent Statistics of the Ising ModelJournal of Mathematical Physics, 1963
- Measurement of Microwave Dielectric Constants of Ferroelectrics Part II. Dielectric Constants and Dielectric Losses of NaNO2 and (Glycine)3·H2SO4Journal of the Physics Society Japan, 1962
- Some Experimental and Theoretical Studies of Ferroelectricity in NaNO2Journal of the Physics Society Japan, 1961