Contrast from dislocations in field-ion images (the origin of the ‘cross-over’ effect)
- 1 January 1969
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 19 (157), 181-187
- https://doi.org/10.1080/14786436908217772
Abstract
The contrast from dislocated crystals in the field-ion microscope is well understood in terms of the geometrical interaction between the dislocation and the surface. This paper considers the modification of the evaporated end form of the specimen close to the dislocation and assumes a constant width of the imaging pole rings. The type of contrast to be expected from single dislocations, dipoles and loops is considered and compared with real examples. In particular it is shown that the ‘cross-over’ effect arises from dipoles or loops.Keywords
This publication has 8 references indexed in Scilit:
- The occurrence of glissile Shockley loops in field-ion specimens of iridiumPhilosophical Magazine, 1968
- Contrast from stacking faults and partial dislocations in the field-ion microscopePhilosophical Magazine, 1968
- The interpretation of field-ion micrographs: Contrast from perfect dislocation loopsPhilosophical Magazine, 1968
- The bond structure of computer-simulated field-ion imagesPhilosophical Magazine, 1967
- COMPUTER-SIMULATED ION-EMISSION IMAGES OF DISLOCATIONS: SCREW DISLOCATION AT THE CENTER OF {420}Applied Physics Letters, 1966
- Field Ion Microscopic Observations of Dislocation Structures at Grain BoundariesJournal of Applied Physics, 1966
- Cavities in tungstenJournal of the Less Common Metals, 1965
- The direct observation of imperfections in crystalsReports on Progress in Physics, 1965