Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices
- 1 March 1987
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 30 (3), 259-265
- https://doi.org/10.1016/0038-1101(87)90181-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Decomposition of generation-recombination noise spectra in separate LorentziansSolid-State Electronics, 1985
- Generation-recombination noise in p-type siliconSolid-State Electronics, 1982
- A review of some charge transport properties of siliconSolid-State Electronics, 1977
- Semiconductor impurity analysis from low-frequency noise spectraIEEE Transactions on Electron Devices, 1971